The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 02, 1982
Filed:
Apr. 07, 1980
Erwin Sick GmbH, Optik-Elektronic, Waldkirch, DE;
Abstract
Optical fault seeking apparatus for material webs uses an optical scanning device to scan the material webs point by point line by line. The optical scanning device consists of a laser light source (17) which projects a light beam via a micro-objective (19), a cylindrical lens (20), and a further objective onto a mirror wheel arrangement (14) which is located substantially at the focus of a strip-like concave mirror (23). A light beam (24) is produced in the image space of the strip-like concave mirror (23) and generates a scanning light bead in a scanning plane through which the material web passes. The mirror wheel arrangement (14) has at least first and second alternately operating types of mirror surfaces which serve to alternately project light beads of different size and/or shape onto the material web thus enabling different types of fault to be reliably detected. The different types of scanning light bead are produced either by different curvatures of the faces (15) and (17) of the mirror wheel arrangement (14) or by the use of other optical means alone or in combination with differently shaped faces of the mirror wheel. Certain embodiments operate using two mirror wheels in tandem.