The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 26, 1982
Filed:
May. 22, 1980
Applicant:
Inventor:
Thomas A Nussmeier, Thousand Oaks, CA (US);
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356349 ; 356358 ;
Abstract
An interferometric distance measurement method which utilizes a sequence of at least two closely spaced optical wavelengths in order to achieve ambiguity resolution during the measurement procedure. In so doing, this method performs the equivalent of measuring distances at a relatively long wavelength by measuring the phase difference at two closely spaced optical wavelengths and computing the effective phase measurement at a wavelength which corresponds to the frequency difference between the two optical wavelengths measured.