The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 26, 1982
Filed:
Jun. 09, 1980
Wilbur I Kaye, Corona Del Mar, CA (US);
Beckman Instruments, Inc., Fullerton, CA (US);
Abstract
A light scattering photometer including a rotating segmented mirror intercepting light from a laser source and alternately directing the light into a sample zone along an optical axis in first and second opposite directions. A mask annulus coaxial with the optical axis intercepts light scattered from the sample in an incremental angle .DELTA..theta. at a selected angle .theta. with respect to the axis. As the direction of sample illumination alternates, the annulus alternately intercepts forward scatter and back scatter of light from the sample at angles .theta. and 180.degree.-.theta., respectively, and passes the forward and back scatter in alternate succession to a detector. The detector output signal is demodulated to derive near-simultaneous forward and back scatter measurements from the sample. The photometer permits measurement at small values of .theta. approaching 0.degree. and hence permits near-simultaneous scatter measurements at forward and back scatter angles spaced by an angle approaching 180.degree..