The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 12, 1982
Filed:
Jun. 24, 1980
Applicant:
Inventor:
Louis F Feiner, Eindhoven, NL;
Assignee:
U.S. Philips Corporation, New York, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
324312 ; 324307 ; 324309 ;
Abstract
It has been found that devices for determining nuclear spin density distributions in an object by means of nuclear spin resonance measurements produce artefacts in the calculated density distributions. The artefacts occurring are dependent of the gradient magnetic fields which are used during the measurements and which influence the excited nuclear spin. The invention concerns two filters for elimination of the artefacts in dependence of the kind of modulation of the gradient magnetic field.