The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 12, 1982
Filed:
Jan. 02, 1981
Applicant:
Inventors:
Assignee:
Hitachi, Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
73587 ; 364507 ;
Abstract
AE signals due to a crack developed in a metal test object are detected by a number of AE sensors mounted on the metal test object. Based on time differences between the signals from the respective AE sensors, crack source points are determined. Then, based on the crack source points, a crack source plane is determined. The crack source plane is divided into a number of areas and a point of maximum number of crack source points in each of the areas is determined. Based on the points of maximum number of crack source points in the respective areas, a shape of the crack in the test object is determined.