The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 05, 1982

Filed:

Jul. 28, 1980
Applicant:
Inventors:

Walter M Madigosky, Silver Spring, MD (US);

Gilbert F Lee, Silver Spring, MD (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
73575 ; 73584 ; 73574 ;
Abstract

A method and apparatus for measuring the dynamic material constants of rur compounds. The rubber compound is tested in strip form by attaching one end of the strip to an electromechanical shaker while the opposite end of the strip is suspended under constant tension. The electromechanical shaker propagates an acoustic wave in the test strip and a piezoelectric transducer positioned at a first point on the test strip measures the mechanical response of the strip for phase and amplitude. The shaker is programmed to step piecewise over the frequency range from 100 Hz to 40 KHz by a frequency synthesizer. The distance between the shaker and the transducer is changed and data is obtained for a second point on the strip. The test values obtained are used to calculate Young's Modulus and the loss factor for the rubber compound.


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