The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 21, 1982
Filed:
Nov. 07, 1980
Applicant:
Inventors:
John J Flaherty, Elk Grove Village, IL (US);
Eric J Strauts, Park Ridge, IL (US);
Helmut F Wagerer, Des Plaines, IL (US);
Timothy C Loose, Chicago, IL (US);
Assignee:
Magnaflux Corporation, Chicago, IL (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
364580 ; 324238 ;
Abstract
An eddy current type of nondestructive testing instrument is disclosed in which the operating frequency is automatically adjusted in accordance with a comparison of output signals obtained in scanning operations in which the frequency is adjusted over its range. The system may be used, for example, in providing lift-off compensation for conductivity measurements or flaw detection or it may be used for sorting of parts of different characteristics.