The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 21, 1982
Filed:
Sep. 17, 1980
Khaim Lisnyansky, Central Valley, NY (US);
International Paper Company, New York, NY (US);
Abstract
A new X-ray fluorescence method for testing a sample having two essentially parallel planar faces that provides full matrix effect compensation is disclosed. The intensities of the transmitted and fluorescent beams of photons are measured by X-ray detectors, and the X-ray source and the two detectors are operated so that ##EQU1## where .PHI. is the angle of the primary beam to one face of the sample, .PSI. is the angle of the fluorescent beam to either face of the sample, E.sub.1 is the energy of the photons of the primary beam, and E.sub.2 is the characteristic electron orbital transition energy for the element of interest. From the ratio of the two intensities the mean average concentration of the element is calculated directly without iterative or other complex procedures.