The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 14, 1982

Filed:

Jun. 09, 1980
Applicant:
Inventors:

Kenneth French, Merrimack, NH (US);

Alfred Piorkow, Lancaster, SC (US);

Assignee:

GTE Products Corporation, Stamford, CT (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B / ; G01B / ;
U.S. Cl.
CPC ...
356394 ; 2502 / ; 356384 ;
Abstract

A comparator mask for use in apparatus for measuring aperture size of apertured material includes a light transparent section and at least one other section having alternate light transparent and opaque sectors whereby the comparator mask overlays the apertured material to provide an area of light transmission utilized to determine the dimensions of the aperture of the apertured material.


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