The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 31, 1982

Filed:

Aug. 15, 1980
Applicant:
Inventors:

Clifford A Landsness, Akron, OH (US);

Thomas M Buehrle, Akron, OH (US);

Assignee:

The B.F. Goodrich Company, New York, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324 54 ;
Abstract

A mat testing apparatus having an enclosed test chamber with a pair of moveable electrode plates that are cooperative with two pairs of vertically disposed stationary electrode plates. Such pairs of plates are cooperative to define a clearance space between each pair which are operative to receive a portion of a mat material for testing its non-conductivity to a high electrical charge. Feed means are provided to index a predetermined length of matting to the respective clearance spaces between each pair of plates to test spaced portions of a mat. Take-up means are provided at the end of the feed means for wind-up of the mat material.


Find Patent Forward Citations

Landsness, Clifford. (1982). Mat testing apparatus (U.S. Patent No. 4347477). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4347477

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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