The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 24, 1982

Filed:

Jul. 30, 1980
Applicant:
Inventors:

Henry L Buijs, Sillery, Quebec, CA;

Garry L Vail, Neuschatel, Quebec, CA;

Jean-Noel Berube, Ancienne Lorette, Quebec, CA;

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356346 ; 356363 ;
Abstract

A Fourier transform spectrometer in which an alignment system is provided for keeping the moving mirror accurately parallel to its original orientation. A reference laser beam is supplied to the spectrometer and if the moving mirror tilts to become out of parallelism then bars appear in the output field. Three detectors arranged at the vertices of a right-angled triangle detect such bars and provide error signals to a mirror control system. The detectors also receive spurious signals caused by stray reflections at the beamsplitter-compensator plate. By providing a square-shaped reference beam which is masked by an L-shaped opening such spurious signals are eliminated.


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