The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 17, 1982
Filed:
May. 08, 1980
Theodore Provder, Olmsted Falls, OH (US);
Richard M Holsworth, Westlake, OH (US);
Mark E Koehler, Middleburg Heights, OH (US);
SCM Corporation, Cleveland, OH (US);
Abstract
A method and apparatus for photogoniometric analysis of surfaces is disclosed. A photogoniometric instrument includes a light source (12) for providing a collimated beam of light illuminating a test surface (18). A light detector (20) is mounted for rotation about the point of intersection of the illuminating beam on the test surface. A motor (44) drives the detector through a range of reflectance angles, and a microcomputer (52) digitizes the detector output periodically, storing the digitized data words in its memory (68). These stored words define a photogoniometric curve (FIG. 2A) including a specular portion (FIG. 2D) and a nonspecular, or diffuse, portion (FIG. 2C). A host computer (62) receives the photogoniometric data from the microcomputer, deconvolutes the data into spectral and diffuse portions, and analyzes the two portions separately from one another. To accomplish this deconvolution, the host computer subtracts from the photogoniometric data the actual reflectance characteristic of a standard surface whose characteristic lacks the specular peak. This diffuse standard reflectance characteristic is stored in the host computer memory in the form of a mathematical equation which has been curve fitted to the actual reflectance characteristics of the diffused standard.