The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 17, 1982

Filed:

Jul. 10, 1980
Applicant:
Inventors:

Rudolf Heller, Zurich, CH;

Walter Schindler, Zurich, CH;

Assignee:

Contraves AG, Zurich, CH;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
F16M / ;
U.S. Cl.
CPC ...
248542 ; 2481231 ; 2482801 ; 248648 ;
Abstract

An auxiliary apparatus at a stand for an optical observation device, such as a surgical microscope is disclosed, which contains a stand at which there is mounted the surgical microscope. The stand comprises a number of rotary and brake bearings, a support arm and a pivotal arm as well as a hinge parallelogram. The surgical microscope or other instrument can be freely adjustable, but fixed in position, throughout a predetermined spatial region as concerns its position and orientation. Arranged at the parallelogram is a web or strap for mounting a support element, at which there is laterally arranged a holder for the attachment of the housing of a brake bearing and a head element. In the head element there is movably mounted by means of a ball hinge element a coupling element structured for receiving and attaching the surgical microscope. In order to level the parallelogram there is arranged a levelling device at the brake bearing and in order to avoid a tilting movement of the parallelogram the suspended microscope is adjustable horizontally and vertically by means of adjustment elements, such as adjustment screws, arranged at the support element.


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