The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 10, 1982
Filed:
Apr. 14, 1980
Donald R Jacobson, Madison, WI (US);
Radiation Measurements, Inc., Middleton, WI (US);
Abstract
A measuring tool (10) for determining the thickness and position of the X-ray beam of a computer is disclosed which allows the information about the X-ray beam to be derived by analysis of a tomographic image taken of the measuring tool. The measuring tool (10) includes a phantom (12) which has formed therein a plurality of receptacles (14) which receive inserts (16). At least two of the inserts (16) each include therein an image creating pattern (20) including a helical pattern (22) and a center indicator (24) so that both thickness and positioning information can be obtained from the computer-generated tomographic image taken of the tool by examining the images created of the helical patterns (22) and center indicators (24) in the inserts (16).
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile