The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 03, 1982
Filed:
Dec. 03, 1979
U.S. Philips Corporation, New York, NY (US);
Abstract
A method of and an apparatus for tomographic examination by X-ray or gamma ray scanning of structures, intended for the display of images of slices of the structure examined by determination of the electron density in each volume element of these slices. Using an X-ray or gamma ray source, a stationary principal detector and an auxiliary detector which is aligned with the source, for each volume element of each slice two measurements are performed of the diffusion by the Comption effect towards the principal detector and two measurements are performed of the transmission between the source and the auxiliary detector, starting with the slice nearest to the principal detector and proceeding to the slice which is situated furthest from this detector. The measuring results are progressively used for calculating the exact electron density throughout the structure examined.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile