The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 27, 1982

Filed:

Nov. 07, 1979
Applicant:
Inventors:

Muneharu Sugiura, Tokyo, JP;

Kazuo Minoura, Yokohama, JP;

Setsuo Minami, Kawasaki, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03G / ; G03B / ;
U.S. Cl.
CPC ...
355-8 ; 355 51 ; 355 60 ;
Abstract

A scanning projection apparatus including a first imaging optical system, a first plane provided on one side of the optical system, a deflector for deflecting a light beam emerging from the first plane and passing through the first imaging optical system, a second imaging optical system for receiving the light beam deflected by the deflector and a second plane provided at the focusing position of the light beam by the second imaging optical system, whereby the first plane is scanned with a slit of a width .DELTA.S, using the deflector, and the thus obtained slit image of the first plane is projected in succession on a determined position in said second plane, wherein the slit width .DELTA.S is selected to satisfy a relation .DELTA.S<1/Rp in which Rp represents the resolving power of the image on the second plane, and wherein the first or second imaging optical system includes elements for correcting the image magnification in the longitudinal direction of the slit.


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