The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 20, 1982
Filed:
May. 19, 1980
Applicant:
Inventor:
Joseph Franks, Teddington, GB;
Assignee:
Ion Tech Limited, Teddington, GB;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
250307 ; 250311 ;
Abstract
Method and apparatus for preparing a specimen for observation under the electron microscope by ion erosion. A saddle-field ion source is employed to irradiate the specimen with the specimen held in close proximity spacing with respect to the cathode aperture of the ion source. Such close proximity spacing ensures that the specimen is thinned at a rapid rate comparable with the rates attained with chemical etching.
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Franks, Joseph. (1982). Preparation of material for examination by transmission electron (U.S. Patent No. 4340815). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4340815
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile