The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 20, 1982

Filed:

May. 19, 1980
Applicant:
Inventor:

Joseph Franks, Teddington, GB;

Assignee:

Ion Tech Limited, Teddington, GB;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
250307 ; 250311 ;
Abstract

Method and apparatus for preparing a specimen for observation under the electron microscope by ion erosion. A saddle-field ion source is employed to irradiate the specimen with the specimen held in close proximity spacing with respect to the cathode aperture of the ion source. Such close proximity spacing ensures that the specimen is thinned at a rapid rate comparable with the rates attained with chemical etching.


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