The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 13, 1982
Filed:
May. 19, 1980
Applicant:
Inventor:
Tzuo-Chang Lee, Bloomington, MN (US);
Assignee:
Honeywell Inc., Minneapolis, MN (US);
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B / ; G01S / ; G06G / ;
U.S. Cl.
CPC ...
3501 / ; 343 / ; 364822 ;
Abstract
An optical system for creating the ambiguity function of a moving target is disclosed. The two signals which are to be used in the analysis are coded on spatial data masks as two-dimensional arrays of one-dimensional functions. The frequency scaling property of a post lens Fourier Transform is utilized to apply a variable scaling factor to at least one of the functions. This is accomplished by passing a beam of substantially coherent light through a cylindrical Fourier Transform lens before it passes through the data masks. At least one of the data masks is then set at an angle other than perpendicular to the beam path.