The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 22, 1982

Filed:

Oct. 01, 1980
Applicant:
Inventors:

Rudolf Schnabl, Rodenbach, DE;

Helmut Becker, Hanau, DE;

Assignee:

W. C. Heraeus GmbH, Hanau, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
3241 / ; 3241 / ;
Abstract

To measure contact resistance between a probe and a terminal sample, and to insure gentle engagement of the probe on the sample, a scale beam is used which has an adjustable engagement weight, and which is lowered under control of a cam disk with an interposed magnetic system in which two magnets of equal polarity are placed adjacent each other so that, due to the repelling force of the two magnets, jolt-free, vibration-free engagement is possible, providing in effect a magnetic buffer. Preferably, the probe is a test wheel which, upon lowering from a raised position, can be disengaged from the drive motor which, when the test probe is off the sample terminal, rotates the wheel so that a fresh wheel surface is available for subsequent measurement. Engagement force can be controlled by suitable positioning of a counter weight, for example by a servo motor.


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