The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 01, 1982

Filed:

Oct. 31, 1979
Applicant:
Inventor:

Philip H Sutterlin, Sunnyvale, CA (US);

Assignee:

Ampex Corporation, Redwood City, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ; G06F / ;
U.S. Cl.
CPC ...
371 15 ; 324 / ; 360 31 ; 371 25 ;
Abstract

A test control circuit includes a channel selector circuit and input and output buffers, which cooperate with input/output buses and respective latches of the multichannel apparatus, to allow an operator to select one or more input buses, and one or more output buses, of a respective channel or channels of the multichannel apparatus. Thus the circuit allows selectively applying an input test signal to one or more channels via the front of the apparatus, while selectively monitoring the resulting output signal from the channel or channels also via the front of the apparatus. An exemplary purpose of the test control system is to facilitate the channel alignment and head azimuth adjustment of, for example, a multichannel audio tape recorder.


Find Patent Forward Citations

Sutterlin, Philip. (1982). Test control circuit for multichannel apparatus such as tape recorders (U.S. Patent No. 4333177). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4333177

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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