The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 01, 1982
Filed:
Jun. 11, 1980
Anton J Miller, Allentown, PA (US);
Bell Telephone Laboratories, Incorporated, Murray Hill, NJ (US);
Abstract
A method and apparatus for checking the orientation of crystal plates in a stacked configuration. The plate stack (15) is placed between a polarizer (11) and analyzer (12). A cylindrical lens (13) placed between the stack and analyzer is utilized as a convergent element. Included with the stack are reference plates (17, 18) having known orientation angles representing the upper and lower limits of the desired orientation tolerance. Monochromatic light is made incident on one surface of the plates in the stack through the polarizer. Since the crystals are birefringent, an interference pattern will be produced by light emerging from the opposite surface. Due to the presence of the cylindrical lens, this pattern can be viewed as a series of essentially linear, parallel bands of light. Deviations within a particular band are compared with bands produced by the reference plates to determine if the angle of each plate falls within the desired limits.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile