The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 25, 1982

Filed:

Apr. 07, 1980
Applicant:
Inventor:

Adolf Mlot-Fijalkowski, Lincolnwood, IL (US);

Assignee:

Magnaflux Corporation, Chicago, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
73104 ;
Abstract

Method and composition for detecting flaws in a workpiece utilizing either white light or ultraviolet light wherein a penetrant solution is applied to the surface of the workpiece, the penetrant solution containing a rhodamine dye dissolved in a solvent, the dye possessing an inherent color and being capable of fluorescing under the influence of ultraviolet light. The excess penetrant is removed from the surface in accordance with usual practice, while leaving penetrant entrapped in any surface flaws. An improved developer is applied to the surface, the developer consisting of a suspension including a finely divided developer powder suspended in the same dye solvent as in the penetrant in a sufficient amount to lower the concentration of rhodamine dye in the entrapped penetrant below that at which quenching of fluorescence occurs. The indications thus produced under both visible light and ultraviolet light are distinct and non-blurring, enabling the piece to be inspected under either type of light source.


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