The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 11, 1982
Filed:
Jun. 02, 1980
Applicant:
Inventors:
Toshihide Fujiwara, Fuchu, JP;
Nobutaka Kaneko, Hachiouji, JP;
Assignee:
Olympus Optical Co., Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
250548 ; 356400 ; 356444 ;
Abstract
A method for detecting samples by comparing outputs corresponding to a carrier portion free from sample with those corresponding to a carrier portion onto which a sample is applied while detecting said outputs with a plural number of sample detectors arranged in the direction perpendicular to the shifting direction of a carrier, selecting a sample detector showing the highest output reduction ratio as the one to be utilized for sample detection and detecting the end edge of a sample as a time at which output of said sample detector changes from a level darker than a preset value to another level brighter than said preset value.