The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 11, 1982

Filed:

Apr. 14, 1980
Applicant:
Inventor:

Joseph Wilder, Princeton, NJ (US);

Assignee:

Sangamo Weston, Inc., Norcross, GA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356375 ; 2502 / ;
Abstract

A system for finding the position of a workpiece surface relative to a reference through non-contact gauging. The system uses a radiant energy beam projected such that an illuminated spot moves along the workpiece surface with movement of that surface relative to the reference along a measurement direction. An array-type image detector, which is out of physical contact with the workpiece, detects the illumination at each of a number of small areas of the workpiece surface and generates signals representative of the detected illumination. These signals are converted into a test signal which is a function of the difference in overall illumination between larger areas of the workpiece surface. A reference signal is produced and stored for two known positions of a workpiece surface. The test signal and the reference signal are combined with each other to produce a measurement signal indicative of the position of the workpiece surface relative to the reference.


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