The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 11, 1982
Filed:
Feb. 04, 1980
Fritz-Peter Schaefer, Goettingen, DE;
Jan Jasny, Warsaw, PL;
Max-Planck-Gesellschaft zur Foerderung der Wissenschaften e.V., Goettingen, DE;
Abstract
An interferometer system for measuring the wavelength of laser light or and other optical radiation comprises an interferometer with a radiation input for a reference beam of a given wavelength, a sample radiation input for a sample beam of unknown wavelength, and a beam splitter for splitting up an incoming beam into two part-beams, and a system for changing the optical lengths of two part-beam optical paths as used by the reference beam and, parallel to it, the beam whose wavelength is to be measured. There is furthermore a detector for converting output beams from the interferometer into representative electrical signals and a signal processing circuit coupled to the detector means. Furthermore in the part-beam paths there is an optical part in the form of a parallelepipedic transparent body able to be rotated for the changing of the lengths of the paths of the beams in relation to each other, and a reflector system for reflecting back the part-beams, coming from the turning part, back into themselves.