The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 11, 1982
Filed:
Aug. 10, 1979
James C Fletcher, , US;
Alain L Fymat, Pasadena, CA (US);
Other;
Abstract
A particle size spectrometer having a fixed field of view within the forward light scattering cone at an angle .theta..sub.s between approximately 100 and 200 minutes of arc (preferably at 150 minutes), a spectral range extending approximately from 0.2 to 4.0 inverse micrometers (.mu.m.sup.-1), and a spectral resolution between about 0.1 and 0.2 .mu.m.sup.-1 (preferably toward the lower end of this range of spectral resolution), is employed to determine the distribution of particle sizes, independently of the chemical composition of the particles, from measurements of incident light, I.sub.o, at each frequency, .sigma. (=1/.lambda.), and scattered light, I(.sigma.), according to the equation: ##EQU1## where l=2.pi.sin.theta., .theta. being the fixed viewing angle .theta..sub.s at which scattered light is measured, r is particle size, .sigma. is the reciprocal of wavelength, J.sub.1 is a Bessel function of first kind and order unity, Y.sub.1 is a Bessel function of second kind and order unity. The quantity, I.sub..sigma., is the ratio of scattered light to incident light at each frequency interval. The apparatus is a passive remote sensor that can be used in laboratories, field stations, flying aircrafts and airships, and on board an orbiting satellite.