The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 11, 1982

Filed:

Jan. 08, 1980
Applicant:
Inventors:

Kazuo Minoura, Yokohama, JP;

Takehiko Kiyohara, Zama, JP;

Haruo Uchiyama, Kawasaki, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B / ;
U.S. Cl.
CPC ...
350-68 ; 358199 ;
Abstract

A two-dimensional scanning device constructed with first deflector to deflect a collimated beam, second deflector to deflect an incident beam in the direction orthogonally intersecting the deflecting direction of the first deflector, a scanning lens interposed between the first and second deflectors, a scanning plane to focus a scanning beam from the scanning lens through the second deflector, and an expedient to obtain a distortion-free two-dimensional scanning pattern on the scanning plane by rotating the scanning plane around a rotational axis in the direction orthogonally intersecting the deflecting direction of the second deflector in synchronism with rotation of the second deflector.


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