The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 04, 1982

Filed:

Jan. 16, 1980
Applicant:
Inventor:

Joshua Raif, Kiryat Ono, IL;

Assignee:

Laser Industries, Ltd., Tel Aviv, IL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
351-9 ; 351 16 ;
Abstract

An ophthalmoscopic instrument for measuring eye defects, particularly cataract and flare, is described including a beam-splitter for splitting a light-beam into a first portion travelling through a first path to the examined eye from which it is reflected back to a viewing station, and a second portion travelling through a second path to a light scatterer from which it is reflected back to the viewing station. A variable filter is provided in the second path and is varied to match the intensity of the light arriving at the viewing station from the second path with the light arriving at the viewing station from the first path, to provide an indication of the intensity of the later light. The instrument further includes a second filter which is selectively either introduced into the second path to adapt the instrument for measuring flare, or removed from the second path to adapt the instrument for measuring cataract.


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