The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 27, 1982
Filed:
Feb. 27, 1979
Applicant:
Inventors:
Timothy R Pryor, Windsor, CA;
Omer L Hageniers, Windsor, CA;
Walter J Pastorius, Windsor, CA;
Nicholas Liptay-Wagner, Windsor, CA;
Donald A Clarke, Windsor, CA;
Blaine Richards, Indianapolis, IN (US);
Assignee:
Diffracto Ltd., Ontario, CA;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ; G02B / ;
U.S. Cl.
CPC ...
356445 ; 250224 ; 250572 ; 350293 ; 356237 ;
Abstract
A method and apparatus is disclosed for determining physical characteristics, such as defects, in the outer surface of an elongate object, wherein the object to be inspected passes through an aperture of a mirror surface which is a conical surface of revolution. Light directed onto the mirror surface in an axial direction is reflected by the object surface, imaged, and analyzed to determine a physical characteristic of the object surface.