The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 27, 1982

Filed:

Jun. 26, 1980
Applicant:
Inventors:

Junichi Ono, Kyoto, JP;

Isao Fukui, Kyoto, JP;

Naoki Imamura, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
356313 ;
Abstract

A method of emission spectrochemical analysis is provided which comprises the steps of producing a predetermined number of spark discharges between an electrode and a specimen containing an element in a first and second state. The intensity of emission of light caused by each of the spark discharges is measured and a frequency distribution of the measured intensities of emission is obtained. The distribution is separated into an area of normal distribution and an area outside the area of normal distribution, and an intensity of emission value is selected. The amount of the element in the first state is determined as a function of the selected intensity of emission multiplied by the area of normal distribution and the amount of the element in the second state is determined as a function of the selected intensity of emission multiplied by the area outside the area of normal distribution.


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