The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 20, 1982

Filed:

Dec. 10, 1979
Applicant:
Inventors:

Hideki Kohno, Tokyo, JP;

Hidemi Shiono, Akikawa, JP;

Shinji Yamamoto, Hachioji, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
364414 ; 250336 ; 2504 / ; 358111 ;
Abstract

A method is disclosed in which projection images of a certain cross-section of an object are produced through irradiation from various directions to the cross-section, and a three-dimensional image of the cross-section is reconstructed from the projection images. A convolution integral operation is performed on the projection images by means of a weighting function obtained from a function whose second differentiation is positive in at least a predetermined range of a spacial frequency domain and which has a positive first-differential coefficient at a point where the spacial frequency is equal to zero.


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