The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 30, 1982
Filed:
Nov. 30, 1979
Applicant:
Inventor:
Chikara Nagano, Tokyo, JP;
Assignee:
Olympus Optical Co., Ltd., Hachiouji, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B / ;
U.S. Cl.
CPC ...
350414 ;
Abstract
A microscope objective lens system by using a Gauss type lens system, in which the N. A. is large, the working distance is long, the image surface is flat over a wide angle of view and various aberrations are well corrected. The system comprises a first lens component comprising two or three single positive lenses, a second lens component comprising a cemented meniscus lens having its convex surface faced to the object side, a third lens component comprising a cemented meniscus lens having its concave surface faced to the object side, and a fourth lens component comprising a single positive lens.