The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 23, 1982
Filed:
Jul. 18, 1979
Hitachi, Ltd., Tokyo, JP;
Abstract
In a Fourier transform nuclear magnetic resonance spectrometer, as is known, a pulse modulated radio frequency is applied to a sample placed in a magnetic field, and a free induction decay signal resulting from the above application is Fourier transformed to obtain a nuclear magnetic resonance spectrum. In such a spectrometer, a material having a predetermined resonance peak, for example, tetramethylsilane is used as a reference sample, and the center frequency of the pulse modulated radio frequency is successively varied while maintaining a constant magnetic field intensity. The position of peak of tetramethylsilane in frequency spectra thus obtained is varied with the change of the center frequency. By measuring successively the signal strength of the peak, there can be obtained a frequency characteristic of a receiving system employed in the spectrometer, which is used to obtain correction coefficients of the receiving system. By multiplying a frequency spectrum of a sample to be analyzed by the correction coefficients, the frequency characteristic of the receiving system is corrected, and thus the signal strength of the frequency spectrum can be indicated with high accuracy.