The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 23, 1982

Filed:

Feb. 04, 1980
Applicant:
Inventors:

William P Holland, West Redding, CT (US);

Anthony Pellegrino, New Fairfield, CT (US);

Assignee:

The Machlett Laboratories, Inc., Stamford, CT (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G03B / ;
U.S. Cl.
CPC ...
250406 ; 250402 ;
Abstract

A source of X-rays encompassing a rotating target is provided with a detector of X-rays located outside a port of a housing of the source and positioned at or near a tangent line to the radiating surface for observing variations in the radiation intensity due to rotation of the target, the variations being pronounced due to the heel effect of the radiation pattern. In one embodiment, the X-ray detector employs a scintillation material and is coupled by a light pipe to a photodetector which is removed from the path of the radiation and detects scintillations of the X-ray detector. Alternatively, the photodetector and light pipe may be deleted by the use of a detector of germanium, silicon or an ion chamber which converts X-ray photons directly to an electric current.


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