The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 23, 1982

Filed:

Jul. 09, 1980
Applicant:
Inventor:

Takashi Kimura, Zama, JP;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
250307 ; 250310 ; 250311 ;
Abstract

This invention relates to a method of correcting astigmatism in scanning electron microscopes and similar equipment which insures accurate correction of astigmatism simply by matching an astigmatism-correcting image, appearing on part of a Braun tube screen, to a predetermined point (such as a mark) on the screen, instead of depending on skill and perception. The apparatus for correcting astigmatism in scanning electron microscopes and similar equipment according to this invention provides a simple structure to implement the above astigmatism correcting method, connecting the X direction astigmatism correcting system through a first switch to one of the horizontal and vertical scanning systems and the Y direction astigmatism correcting system through the second switch to the other thereof.


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