The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 23, 1982

Filed:

Sep. 17, 1979
Applicant:
Inventor:

John D Green, Newark, OH (US);

Assignee:

Manville Service Corporation, Denver, CO (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J / ;
U.S. Cl.
CPC ...
356221 ;
Abstract

The present invention relates to systems for assessing the quality of illumination provided by a lighting environment to a task location in terms of the ability of that illumination to render the contrast of a visual task at the task location. Past systems have been inaccurate, inflexible, or required trained personnel and bulky equipment to make such an assessment. The present system accomplishes this assessment by generating a series of electrical signals, each such signal corresponding to the luminous flux impinging at the task location provided by a discrete, substantially non-overlapping zone of the lighting environment. These signals, when associated with the position of the corresponding zones, accurately describe the flux distribution of the lighting environment, and are used to calculate Equivalent Sphere Illumination, a figure of merit for that lighting environment.


Find Patent Forward Citations

Green, John. (1982). Method and assembly for measuring equivalent sphere illumination in the (U.S. Patent No. 4320969). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4320969

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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