The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 09, 1982
Filed:
Aug. 30, 1979
Applicant:
Inventors:
Toshihiro Kajiura, Osaka, JP;
Norio Oita, Kobe, JP;
Masahiro Mori, Osaka, JP;
Yuichi Fukui, Settsu, JP;
Assignee:
Kanebo Limited, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N / ;
U.S. Cl.
CPC ...
358106 ; 358126 ;
Abstract
An external appearance inspecting system is disclosed. In the system, a TV camera is employed for forming a TV image scope. A detection area and an inspection area are electrically created in the TV image scope. The appearance of an image of an object to be inspected is detected by the detection area. Then, the image of the object is inspected by the inspection area. The inspection area is created at the (N+K).sub.th (N=1, 2, 3 . . . , K=1, 2, 3 . . . ) scanning field of the TV image scope, if the image of the object is detected by the detection area which was created at the N.sub.th scanning field.