The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 09, 1982
Filed:
Apr. 06, 1979
Hisayuki Sagusa, Tabiko, Katsuta-shi, JP;
Hiroshi Hashimoto, Toyooka, Tokaimura, Naka-gun, Ibaraki-ken, JP;
Yasushi Nomura, Yonesawacho, Mito-shi, JP;
Takehide Satou, Ichige, Katsuta-shi, JP;
Ryohei Yabe, Ichige, Katsuta-shi, JP;
Other;
Abstract
An automatic rate analyzing method for determining a concentration of an item in concern contained in a sample to be analyzed comprises steps of irradiating the sample with light thereby to produce a transmitted light signal at a specific wavelength, converting the transmitted light signal into a corresponding electric signal and sampling the electric signal at a given interval thereby to produce a plurality of sample values. The plurality of sample values are grouped into groups each containing a predetermined number of sample values selected for every given number of the sample values. Each of the groups is deviated from the adjacent ones by a number of sample values smaller than the given number. The sample values in each of the groups are added together to produce sums associated with each of the groups. Difference between the sums of every two adjacent groups is determined and divided by the sum associated with either one of the two adjacent groups thereby to produce quotients which are then added together to produce a total sum representing the concentration of the item in concern.