The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 09, 1982
Filed:
Mar. 03, 1980
Takeshi Goshima, Tokyo, JP;
Kazuo Minoura, Yokohama, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
An optical scanning system is disclosed in which only an anamorphic optical system is disposed between a deflector and a scanned surface. The anamorphic optical system comprises a first anamorphic optical system which focuses light in the direction of the scanning line and a second anamorphic optical system which focuses light in a plane normal to the scanning line. The first anamorphic optical system is composed of one or two cylindrical lenses and has an optical means for moving the beam on the scanned surface at uniform speed. The second anamorphic optical system functions to correct a positional error of the scanning beam on the scanned surface caused by the inclination of the deflector from its normal position.