The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 09, 1982
Filed:
Jan. 03, 1980
Applicant:
Inventors:
Assignee:
Canon Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B / ;
U.S. Cl.
CPC ...
350-66 ; 350-68 ; 350-691 ; 358208 ;
Abstract
A two-dimensional scanning apparatus is disclosed which includes first deflector for deflecting a collimated beam, second deflector for deflecting the incident beam in the direction orthogonal to the direction of deflection by the first deflector, a scanning lens disposed between the first and second deflector, a surface to be scanned on which an image of the scanning beam is formed through the second deflector and a device for moving the scanned surface in the direction orthogonal to the surface in synchronism with the rotational motion of the second deflector so as to obtain a two-dimensional, distortionless scanning pattern on the scanned surface.