The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 09, 1982

Filed:

May. 14, 1979
Applicant:
Inventors:

Christian Zaffran, Elancourt, FR;

Jean-Claude Ser, Beynes, FR;

Jean-Pierre Yquel, Colombes, FR;

Assignee:

L'Oreal, Paris, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
73 78 ;
Abstract

A novel automatic test measuring apparatus of the pendulum variety for readily and easily determining film and the like hardness is adapted to automate all the operations necessarily preceding the commencement of a measurement stage using, in connection therewith, a recording unit or printer to supply the operator with the numerical results of all the measurements without personal manipulation(s). In making a measurement, the necessary time count for passing from amplitude .alpha. to amplitude .beta. is effected by means of a photo-electric cell. This records the passage of a pendulum arm having a predetermined period during the time that the oscillation amplitude is higher than .beta.. The involved count gives the measured time necessary for the measurement. The automatic apparatus advantageously reduces error relating to each measurement and increases the number of measurements to be effected on one and the same test film to yield a vastly more reliable mean statistical value. Provision may be made to simultaneously test several films, either by simultaneous of successive mountings of a plurality of films whose hardness is being measured.


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