The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 02, 1982
Filed:
Jun. 11, 1979
Abstract
Methods and apparatus for determining the particle size distribution with respect to selected fraction classes in the direction of flow of a medium are provided in accordance with the teachings of the present invention. A plurality of measuring configurations are employed to pass light through the medium to be measured and to detect the light transmitted therethrough. Each measuring configuration exhibits different resolution with respect to one another and particle size distribution for selected fraction classes is determined as a function of measuring signals derived by each of the plurality of measuring configurations from the transmitted light detected during a run of the medium and sensitivity coefficients of the measuring signals. The sensitivity coefficients employed are dependent upon the associated measuring configuration and fraction class. Thus rather than counting particles per se a measure of the concentration in each fraction class is obtained.