The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 02, 1982
Filed:
Dec. 20, 1979
Philip J Mallozzi, Delaware, OH (US);
Harold M Epstein, Columbus, OH (US);
Robert E Schwerzel, Columbus, OH (US);
Bernerd E Campbell, Upper Arlington, OH (US);
Battelle Memorial Institute, Columbus, OH (US);
Abstract
Apparatus (10) for obtaining EXAFS data of a material (11). A lens (12) directs a pulse of radiant energy (13) from a laser (14) onto a metal target (15) to produce X-rays (16) of a selected spectrum and intensity at the target (15). A baffle (17) directs X-rays (16) from the target (15) onto a spectral dispersive monochromator (18) which directs the spectrally resolved X-rays (16R) therefrom onto a photographic film 20. A film of material (11) is located in the path (22) of only a portion (16L) of the X-rays (16) throughout a selected spectral band, and the resolved X-rays (16R) directed onto the photographic film (20) form two separate images thereon comprising a reference spectrum (26R) representative of a portion of the X-rays (16U) throughout the selected band that was not affected by the film of material (11) and an absorption spectrum (26A) representative of a portion of the X-rays (16L) throughout the selected band that was modified by transmission through the film of material (11). The laser pulse (13) typically has a width of less than about 10 nanoseconds, and the material (11) may be in a highly transient state.