The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 23, 1982
Filed:
Oct. 19, 1979
Nobuo Wakatsuki, Tokyo, JP;
Osamu Itoh, Tokyo, JP;
VLSI Technology Research Association, Kawasaki, JP;
Abstract
For test, a sequential circuit operable in a normal and a shift mode is logically divided into a plurality of partitions, each comprising a first and a second sequence of registers. A testing device specifies the first sequence in each partition, one partition after another, and supplies the registers of the specified first sequence, in the shift mode, with a test pattern prescribed for the specified partition. A pattern resulting from the test pattern is supplied in the normal mode to the registers of the second sequence in the specified partition and shifted out thereof subsequently in the shift mode to be compared with a correct or reference pattern predetermined for the test pattern for detection of a fault. For location of the fault in the specified partition, the test and the shifted-out patterns are combined into a combined pattern, which is supplied to the registers of the first and the second sequences in the normal mode following the shift mode in which the fault is detected.