The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 16, 1982
Filed:
Jul. 09, 1979
Ortwin Muller, Konigsbronn, DE;
Victor Stopar, Oberkochen, DE;
Carl Zeiss-Stiftung, Oberkochen, DE;
Abstract
The invention contemplates eye-examination apparatus wherein modular-component construction enables a base with binocular-microscope viewing structure to selectively serve multiple-instrument functions, one of which is specifically an ophthalmometer. In the form described, the ophthalmometer component is a module which, when selected for use with the base module, provides a direct internally developed read-out of reflected-mire displacement in one of the two optical systems of binocular viewing and which provides via the other binocular optical system a concurrent display of the two reflected-mire images in the course of displacement adjustment; in the other selected employment of the base module, the instrument is a slit-lamp microscope. The ophthalmometer axis coincides with the central axis of symmetry of the slit-lamp microscope, so that no adjustment of the base module is needed in relation to a particular eye to make successive use of the same viewing structure in a slit-lamp mode and in an ophthalmometer mode.