The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 02, 1982

Filed:

Apr. 06, 1979
Applicant:
Inventor:

Gunter Kowalski, Rellingen, DE;

Assignee:

U.S. Philips Corporation, New York, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
364414 ; 2504 / ;
Abstract

The method relates to an X-ray apparatus, which by the rotary scanning with the aid of a fan-shaped radiation beam provides measuring data about the radiation attenuation in the layer of a body, from which subsequently the absorption distribution of the layer being examined is calculated. In such an apparatus it is important that the center of rotation is accurately known. If this center is not exactly known, this leads to blurring in the reconstructed image. If scanning is not performed over a full revolution, this moreover gives rise to streaking artefacts. The method proposed automatically yields the center of rotation from the measuring data, so that during the subsequent reconstruction allowance can be made for the center of rotation.


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