The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 02, 1982

Filed:

Jan. 03, 1980
Applicant:
Inventors:

Kazuo Minoura, Yokohama, JP;

Takehiko Kiyohara, Zama, JP;

Haruo Uchiyama, Kawasaki, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N / ;
U.S. Cl.
CPC ...
250235 ; 350-66 ; 350-67 ; 355-8 ; 358206 ; 358293 ;
Abstract

A two-dimensional scanning device provided with a first deflector for deflecting a collimated beam, a second deflector for deflecting the incident beam in a direction orthogonal to the deflection direction of the first deflector, a scanning lens disposed between the first deflector and the second deflector, a scanning surface for imaging the scanning beam from said scanning lens through the second deflector, and a device for moving the scanning lens in the direction of its optic axis in synchronism with the rotation of the second deflector to thereby obtain a strain-free two dimensional scanning figure on the scanning surface.


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