The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 26, 1982
Filed:
Jun. 26, 1980
Frederick J Aichelmann, Jr, Hopewell Junction, NY (US);
Bruce E Bachman, Hopewell Junction, NY (US);
International Business Machines Corp., Armonk, NY (US);
Abstract
Apparatus is disclosed for quickly testing memory arrays of multiple recirculating loop memory elements and for locating faulty elements, if any, within designated subdivisions of said array. All loops are loaded with identical test bits. The loaded data is verified and faulty elements, if any, are located by means of a plurality of comparison AND gates. Each gate is connected to the output of a respective subdivision of the array elements and produces a first output signal when all such outputs are identical (on a serial bit-by-bit basis) and produces a second output signal when all said outputs are not identical. The output signals from the respective comparison AND gates are sensed in serial succession to locate the array subdivision containing any faulty elements.