The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 26, 1982
Filed:
Nov. 12, 1980
Shinichi Kamachi, Hino, JP;
Toshihide Fujiwara, Fuchu, JP;
Olympus Optical Co., Ltd., Tokyo, JP;
Abstract
A method for determining boundary points on electrophoretic densitograms comprising a bounding point judging step for locating boundary points on electrophoretic densitograms, a normal fraction judging step for judging whether or not the boundary points located by said boundary point judging step are normal, and a standard position computing step for determining standard positions on the basis of data having been judged as normal by said normal fraction judging step, said method being so adapted as to determine boundary points taking reference to the standard positions located by said standard position computing step by utilizing unknown samples for locating the standard positions and perform data processing without using standard samples.