The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 19, 1982
Filed:
Jun. 03, 1980
Applicant:
Inventors:
Joseph G Montminy, Quebec, CA;
Paul C Chevrette, Neufchatel, CA;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N / ;
U.S. Cl.
CPC ...
358139 ; 364525 ; 364553 ;
Abstract
A testing system for measuring and evaluating the performance of electro-optical systems. The system under test is operated with the optics and electronics functioning in its normal manner. To simulate the type of signal produced by a test object under normal conditions an ideal bar signal is modified to represent normal signal degradation in the components in accordance with the previously measured impulse response of the electro-optical system. This degraded signal is then added at a particular point in the electro-optical system. The simulated signal can be varied in a controlled manner and observer responses noted.